A Fast and Sensitive Built-in Current Sensor for IDDQ Testing

Authors:
Chih-Wen Lu;Chung-Len Lee;Jwu-E Chen
Affiliations:
-;-;-
Venue:
IDDQ '96 Proceedings of the 1996 IEEE International Workshop on IDDQ Testing (IDDQ '96)
Year:
1996

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Abstract

In this work, a fast and highly sensitive Built-in Current (BIC) sensor is proposed for testing static CMOS ICs. The sensor employs a current mirror and an I-V converter to achieve the high sensing speed and high resolution. The circuit is simple and occupies a small area, making it ideal to be integrated into the IC chip for the IDDQ application.