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On-Chip IDDQ Testing in the AE11 Fail-Stop Controller

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Defect level prediction for I_DDQ testing

ITC '98 Proceedings of the 1998 IEEE International Test Conference

6.3 Experimental Results for IDDQ and VLV Testing

VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium

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ITC '97 Proceedings of the 1997 IEEE International Test Conference