A Low-Loss Built-In Current Sensor
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
On the Adaptation of Viterbi Algorithm for Diagnosis of Multiple Bridging Faults
IEEE Transactions on Computers
Diagnosis Method Using ΔIDDQ Probabilistic Signatures: Theory and Results
Journal of Electronic Testing: Theory and Applications
On effective IDDQ Testing of low-voltage CMOS circuits using leakage control techniques
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Diagnosis method based on /spl Delta/Iddq probabilistic signatures: experimental results
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
On the Comparison of IDDQ and IDDQ Testing
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
AN IDDQ SENSOR CIRCUIT FOR LOW-VOLTAGE ICS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
On Effective IDDQ Testing of Low Voltage CMOS Circuits Using Leakage Control Techniques
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
An Histogram Based Procedure for Current Testing of Active Defects
ITC '99 Proceedings of the 1999 IEEE International Test Conference
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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Today's built-in current sensor (BICS) techniques provide I/sub DDQ/ current sensitivity which is adequate for testing and diagnosing near-micron CMOS ICs. However, faulty and fault-free I/sub DDQ/ can become indiscernible at deep submicron levels. This paper describes a novel BICS methodology which improves fault detectability and diagnosability in ULSI CMOS ICs.