Diagnosis of leakage faults with IDDQ
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Algorithms for IDDQ measurement based diagnosis of bridging faults
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Identifying defects in deep-submicron CMOS ICs
IEEE Spectrum
Failure Diagnosis of Structured VLSI
IEEE Design & Test
Microprocessor IDDQ Testing: A Case Study
IEEE Design & Test
IDDQ Test and Diagnosis of CMOS Circuits
IEEE Design & Test
Fault Location with Current Monitoring
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Bridging Defects Resistance Measurements in a CMOS Process
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
A novel built-in current sensor for I/sub DDQ/ testing of deep submicron CMOS ICs
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Current signatures [VLSI circuit testing]
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
On estimating bounds of the quiescent current for I/sub DDQ/ testin
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
CMOS Digital Integrated Circuits Analysis & Design
CMOS Digital Integrated Circuits Analysis & Design
On the Adaptation of Viterbi Algorithm for Diagnosis of Multiple Bridging Faults
IEEE Transactions on Computers
Diagnosis Method Using ΔIDDQ Probabilistic Signatures: Theory and Results
Journal of Electronic Testing: Theory and Applications
On effective IDDQ Testing of low-voltage CMOS circuits using leakage control techniques
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IDDQ Testing for Deep-Submicron ICs: Challenges and Solutions
IEEE Design & Test
Probabilistic mixed-model fault diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Diagnosis method based on /spl Delta/Iddq probabilistic signatures: experimental results
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Replacing IDDQ Testing: With Variance Reduction
Journal of Electronic Testing: Theory and Applications
Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
On the Comparison of IDDQ and IDDQ Testing
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Improving Delta-IDDQ-based test methods
ITC '00 Proceedings of the 2000 IEEE International Test Conference
The Future of Delta IDDQ Testing
ITC '01 Proceedings of the 2001 IEEE International Test Conference
An Histogram Based Procedure for Current Testing of Active Defects
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Eliminating the Ouija® Board: Automatic Thresholds and Probabilistic IDDQ Diagnosis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Built-in Current Sensor for "I{DDQ} Testing of Deep Submicron Digital CMOS ICs
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
An indirect current sensing technique for IDDQ and IDDT tests
GLSVLSI '06 Proceedings of the 16th ACM Great Lakes symposium on VLSI
Graphical IDDQ signatures reduce defect level and yield loss
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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In this paper, we propose a novel IC diagnosis approach, based on probabilistic differential quiescent current (I/sub DDQ/) signatures. Unlike the previous diagnosis approaches using current, this approach, using the maximum likelihood estimation, provides a solid framework allowing to quantify its robustness with respect to current measurement variations. The differential nature of the signatures allows to treat subthreshold leakage currents as a noise source. Results are provided showing the robustness of the approach. The applicability of the approach on embedded logic is also briefly discussed.