Diagnosis of leakage faults with IDDQ
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Algorithms for IDDQ measurement based diagnosis of bridging faults
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Identifying defects in deep-submicron CMOS ICs
IEEE Spectrum
Failure Diagnosis of Structured VLSI
IEEE Design & Test
Microprocessor IDDQ Testing: A Case Study
IEEE Design & Test
IDDQ Test and Diagnosis of CMOS Circuits
IEEE Design & Test
IEEE Design & Test of Computers, 1998 Annual Index, Volume 15
IEEE Design & Test
Increasing Current Testing Resolution
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
On the Current Behavior of Faulty and Fault-Free ICs and the Impact on Diagnosis
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
IDDQ Test: Sensitivity Analysis of Scaling
Proceedings of the IEEE International Test Conference on Test and Design Validity
Fault Location with Current Monitoring
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Application and Analysis of IDDQ Diagnostic Software
Proceedings of the IEEE International Test Conference
Current Signatures: Application
Proceedings of the IEEE International Test Conference
Bridging Defects Resistance Measurements in a CMOS Process
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Toward understanding "Iddq-only" fails
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Diagnosis method based on /spl Delta/Iddq probabilistic signatures: experimental results
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A novel built-in current sensor for I/sub DDQ/ testing of deep submicron CMOS ICs
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Current signatures [VLSI circuit testing]
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
On the Comparison of IDDQ and IDDQ Testing
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
An Histogram Based Procedure for Current Testing of Active Defects
ITC '99 Proceedings of the 1999 IEEE International Test Conference
CMOS Digital Integrated Circuits Analysis & Design
CMOS Digital Integrated Circuits Analysis & Design
The Future of Delta IDDQ Testing
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Quality improvement and cost reduction using statistical outlier methods
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
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This paper presents a diagnostic method based on differential I_DDQ probabilistic signatures, inspired by telecommunications systems. The method and its unique features are described. Then, results from an IC monitor containing controllable faults show the capability of the method to diagnose actual activated faults, despite a strong experimental current standard variation. These results validate previous simulation procedures, which are applied to quantify effects not covered by the monitor experiment, that is, the effect of the load of a bridged node and the effect of the bridge resistance value. These experimental and simulation results reveal the robustness of the proposed diagnosis method, that has identified and located every single fault considered so far.