An algorithm for diagnosing two-line bridging faults in combinational circuits
DAC '93 Proceedings of the 30th international Design Automation Conference
On adaptive diagnostic test generation
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
On the Adaptation of Viterbi Algorithm for Diagnosis of Multiple Bridging Faults
IEEE Transactions on Computers
Diagnosis Method Using ΔIDDQ Probabilistic Signatures: Theory and Results
Journal of Electronic Testing: Theory and Applications
Defect Detection from Visual Abnormalities in Manufacturing Process Using IDDQ
Journal of Electronic Testing: Theory and Applications
IDDQ Test and Diagnosis of CMOS Circuits
IEEE Design & Test
Diagnosis method based on /spl Delta/Iddq probabilistic signatures: experimental results
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Defect Detection from Visual abnormalities in Manufacturing Process Using IDDQ
ETW '00 Proceedings of the IEEE European Test Workshop
Voting model based diagnosis of bridging faults in combinational circuits
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Using fault sampling to compute I/sub DDQ/ diagnostic test sets
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
APPLICATION AND ANALYSIS OF IDDQ DIAGNOSTIC SOFTWARE
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Bridging Fault Diagnosis in the Absence of Physical Information
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Fault Simulation of IDDQ Tests for Bridging Faults in Sequential Circuits
FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing
Reducing fault dictionary size for million-gate large circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Journal of Electronic Testing: Theory and Applications
A study of IDDQ subset selection algorithms for bridging faults
ITC'94 Proceedings of the 1994 international conference on Test
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