On the generation of small dictionaries for fault location
ICCAD '92 1992 IEEE/ACM international conference proceedings on Computer-aided design
An algorithm for diagnosing two-line bridging faults in combinational circuits
DAC '93 Proceedings of the 30th international Design Automation Conference
Diagnosis of leakage faults with IDDQ
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Algorithms for IDDQ measurement based diagnosis of bridging faults
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Fault dictionary compaction by output sequence removal
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Design verification via simulation and automatic test pattern generation
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
On adaptive diagnostic test generation
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Diagnosis of realistic bridging faults with single stuck-at information
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Exploiting dynamic computation in diagnosis of bridging faults
Exploiting dynamic computation in diagnosis of bridging faults
Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Automatic Pattern Generation for Diagnosis of Wiring Interconnect Faults
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Voting model based diagnosis of bridging faults in combinational circuits
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
APPLICATION AND ANALYSIS OF IDDQ DIAGNOSTIC SOFTWARE
ITC '97 Proceedings of the 1997 IEEE International Test Conference
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A diagnostic test generation system for computing I/sub DQQ/ diagnostic test sets for bridging faults in combinational circuits is presented. The system uses fault sampling. Experimental results presented show that fault sampling is a very effective method for computing diagnostic test sets, especially when the number of target faults is very large.