Proofs: a fast, memory efficient sequential circuit fault simulator
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Exact evaluation of diagnostic test resolution
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
On the generation of small dictionaries for fault location
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Switching and Finite Automata Theory: Computer Science Series
Switching and Finite Automata Theory: Computer Science Series
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Diagnostic Fault Simulation of Sequential Circuits
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
Fault dictionary compaction by output sequence removal
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
On Dictionary-Based Fault Location in Digital Logic Circuits
IEEE Transactions on Computers
Dynamic fault diagnosis on reconfigurable hardware
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Modeling the Unmodelable: Algorithmic Fault Diagnosis
IEEE Design & Test
Modeling the unknown! Towards model-independent fault and error diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A diagnostic test generation procedure for synchronous sequential circuits based on test elimination
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A fault diagnosis methodology for the UltraSPARC/sup TM/-I microprocessor
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Fault diagnosis using state information
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
Using fault sampling to compute I/sub DDQ/ diagnostic test sets
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Techniques to Encode and Compress Fault Dictionaries
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
An Improved Fault Diagnosis Algorithm Based on Path Tracing with Dynamic Circuit Extraction
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Diagnostic Test Generation for Sequential Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
POIROT1: A Logic Fault Diagnosis Tool and Its Applications
ITC '00 Proceedings of the 2000 IEEE International Test Conference
The Effects of Test Compaction on Fault Diagnosis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Theory and application of cellular automata for pattern classification
Fundamenta Informaticae - Special issue on cellular automata
Efficient RT-level fault diagnosis methodology
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
An Efficient Dictionary Organization for Maximum Diagnosis
Journal of Electronic Testing: Theory and Applications
A test pattern ordering algorithm for diagnosis with truncated fail data
Proceedings of the 43rd annual Design Automation Conference
Efficient RT-level fault diagnosis
Journal of Computer Science and Technology
Proceedings of the conference on Design, automation and test in Europe
Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware
Journal of Electronic Testing: Theory and Applications
Proceedings of the conference on Design, automation and test in Europe
Reducing fault dictionary size for million-gate large circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Effective diagnostic pattern generation strategy for transition-delay faults in full-scan SOCs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Dynamic fault dictionaries and two-stage fault isolation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Theory and Application of Cellular Automata For Pattern Classification
Fundamenta Informaticae - Cellular Automata
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