Exact evaluation of diagnostic test resolution
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
On improving fault diagnosis for synchronous sequential circuits
DAC '94 Proceedings of the 31st annual Design Automation Conference
Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Diagnostic Fault Simulation of Sequential Circuits
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
GARDA: a diagnostic ATPG for large synchronous sequential circuits
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Sequential Circuit Test Generation Using Dynamic State Traversal
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Fault diagnosis using state information
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Characterization and Implicit Identification of Sequential Indistinguishability
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Full fault dictionary storage based on labeled tree encoding
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Diagnostic Test Pattern Generation for Sequential Circuits
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Vector restoration based static compaction of test sequences for synchronous sequential circuits
ICCD '97 Proceedings of the 1997 International Conference on Computer Design (ICCD '97)
On the Adaptation of Viterbi Algorithm for Diagnosis of Multiple Bridging Faults
IEEE Transactions on Computers
Modelling Digital Circuits Problems with Set Constraints
CL '00 Proceedings of the First International Conference on Computational Logic
Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Accurate Diagnosis of Multiple Faults
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Multiple-fault diagnosis based on single-fault activation and single-output observation
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Electronic Notes in Theoretical Computer Science (ENTCS)
Journal of Electronic Testing: Theory and Applications
On undetectable faults and fault diagnosis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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We propose a procedure for generating test sequences fordiagnosis of synchronous sequential circuits based onstuck-at faults. The test generation procedure avoids theconventional fault-oriented test generation by observingthat a sequence to distinguish two faults can be obtainedfrom a sequence that detects both of the faults (such as atest sequence for fault detection) by changing thesequence so as to "undetect" one of the faults. To achievethis goal, the proposed procedure eliminates parts of a testsequence for fault detection so as to render some of thefaults undetected. The faults that are detected by theresulting sequence are distinguished from the faults leftundetected by the sequence based on pass/fail informa-tion. A pass/fail dictionary suitable for diagnosis with theresulting test sequences is also proposed. Alternatively, aconventional dictionary can be used, and the proposedprocedure can be used to change the time units or outputswhere faults are detected, in order to distinguish them. Wepresent experimental results to demonstrate the levels ofresolution that can be obtained by the proposed procedurewith the proposed pass/fail dictionary, and the number ofsequences required for this purpose.