Exact evaluation of diagnostic test resolution
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
A fast and memory-efficient diagnostic fault simulation for sequential circuits
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Diagnostic Fault Simulation of Sequential Circuits
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
Combinatorial Algorithms: Theory and Practice
Combinatorial Algorithms: Theory and Practice
On adaptive diagnostic test generation
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Integrated fault diagnosis targeting reduced simulation
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Modeling the unknown! Towards model-independent fault and error diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A diagnostic test generation procedure for synchronous sequential circuits based on test elimination
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Multiple fault diagnosis in sequential circuits using sensitizing sequence pairs
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
Fault diagnosis using state information
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Diagnostic Test Pattern Generation for Sequential Circuits
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Implication and Evaluation Techniques for Proving Fault Equivalence
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Diagnostic Test Generation for Sequential Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Expediting Ramp-to-Volume Production
ITC '99 Proceedings of the 1999 IEEE International Test Conference
The Effects of Test Compaction on Fault Diagnosis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Journal of Electronic Testing: Theory and Applications
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