Exact evaluation of diagnostic test resolution
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
An algorithm for diagnosing two-line bridging faults in combinational circuits
DAC '93 Proceedings of the 30th international Design Automation Conference
Algorithms for IDDQ measurement based diagnosis of bridging faults
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Fault dictionary compaction by output sequence removal
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
On the generation of small dictionaries for fault location
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Computers and Intractability: A Guide to the Theory of NP-Completeness
Computers and Intractability: A Guide to the Theory of NP-Completeness
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Test Pattern Generation for Realistic Bridge Faults in CMOS ICs
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
STAFAN: An alternative to fault simulation
DAC '84 Proceedings of the 21st Design Automation Conference
Compact test generation for bridging faults under I/sub DDQ/ testing
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Using fault sampling to compute I/sub DDQ/ diagnostic test sets
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Journal of Electronic Testing: Theory and Applications
Adaptive Debug and Diagnosis Without Fault Dictionaries
Journal of Electronic Testing: Theory and Applications
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Adaptive Diagnosis, a paradigm for diagnosis, is defined. A system based on this paradigm, for I_{DDQ} measurement based diagnosis of bridging faults, is reported. Experimental evaluation of the system shows it to be substantially superior to existing systems, especially for larger circuits.