On the Design of High-Yield Reconfigurable PLA's
IEEE Transactions on Computers
COMPACTEST: A Method to Generate Compact Test Sets for Combinatorial Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Coupling Electron-Beam Probing with Knowledge-Based Fault Localization
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Fault dictionary compaction by output sequence removal
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
On adaptive diagnostic test generation
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Location of Stuck-At Faults and Bridging Faults Based on Circuit Partitioning
IEEE Transactions on Computers
Dynamic fault diagnosis on reconfigurable hardware
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
A fault diagnosis methodology for the UltraSPARC/sup TM/-I microprocessor
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Theory and application of cellular automata for pattern classification
Fundamenta Informaticae - Special issue on cellular automata
An Efficient Dictionary Organization for Maximum Diagnosis
Journal of Electronic Testing: Theory and Applications
Efficient RT-level fault diagnosis
Journal of Computer Science and Technology
Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware
Journal of Electronic Testing: Theory and Applications
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