Coupling Electron-Beam Probing with Knowledge-Based Fault Localization

  • Authors:
  • M. Marzouki;J. Laurent;Bernard Courtois

  • Affiliations:
  • -;-;-

  • Venue:
  • Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
  • Year:
  • 1991

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Abstract