On the generation of small dictionaries for fault location
ICCAD '92 1992 IEEE/ACM international conference proceedings on Computer-aided design
Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Failure Diagnosis of Structured VLSI
IEEE Design & Test
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Making cause-effect cost effective: low-resolution fault dictionaries
Proceedings of the IEEE International Test Conference 2001
Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm
Proceedings of the IEEE International Test Conference 2001
Coupling Electron-Beam Probing with Knowledge-Based Fault Localization
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
A maximal resolution guided-probe testing algorithm
DAC '81 Proceedings of the 18th Design Automation Conference
Fault diagnosis based on effect-cause analysis: An introduction
DAC '80 Proceedings of the 17th Design Automation Conference
POIROT1: A Logic Fault Diagnosis Tool and Its Applications
ITC '00 Proceedings of the 2000 IEEE International Test Conference
On Pass/Fail Dictionaries for Scan Circuits
ATS '01 Proceedings of the 10th Asian Test Symposium
A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Diagnosis of multiple-voltage design with bridge defect
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Fault Table Computation on GPUs
Journal of Electronic Testing: Theory and Applications
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We describe a new type of fault dictionary called a same/different fault dictionary. The same/different fault dictionary is similar to a pass/fail fault dictionary in that it contains a single bit bi, j for every modeled fault fi and test vector tj. However, in a pass/fail fault dictionary, bi, j is determined by comparing the output vector of the faulty circuit with the output vector of the fault free circuit; while in a same/different fault dictionary, bi, j is determined by comparing the output vector of the faulty circuit with a preselected output vector called a baseline output vector. By selecting appropriately the baseline output vectors for all the test vectors, it is possible to obtain increased diagnostic resolution with a same/different fault dictionary compared to a pass/fail fault dictionary. We describe a procedure for selecting baseline output vectors and present experimental results.