Understanding Yield Losses in Logic Circuits
IEEE Design & Test
Fault Diagnosis and Fault Model Aliasing
ISVLSI '05 Proceedings of the IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design
On per-test fault diagnosis using the X-fault model
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
An efficient method for improving the quality of per-test fault diagnosis
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Accurate Whole-Chip Diagnostic Strategy for Scan Designs with Multiple Faults
Journal of Electronic Testing: Theory and Applications
Improve the Quality of Per-Test Fault Diagnosis Using Output Information
Journal of Electronic Testing: Theory and Applications
X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis
IEEE Design & Test
Multiple defect diagnosis using no assumptions on failing pattern characteristics
Proceedings of the 45th annual Design Automation Conference
Proceedings of the conference on Design, automation and test in Europe
Using test data to improve IC quality and yield
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
A Method of Locating Open Faults on Incompletely Identified Pass/Fail Information
IEICE - Transactions on Information and Systems
IEICE - Transactions on Information and Systems
On Detection of Bridge Defects with Stuck-at Tests
IEICE - Transactions on Information and Systems
Automated failure population creation for validating integrated circuit diagnosis methods
Proceedings of the 46th Annual Design Automation Conference
Adaptive Debug and Diagnosis Without Fault Dictionaries
Journal of Electronic Testing: Theory and Applications
Timing-aware multiple-delay-fault diagnosis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Layout-based defect-driven diagnosis for intracell bridging defects
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Diagnosis of integrated circuits with multiple defects of arbitrary characteristics
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - Special issue on the 2009 ACM/IEEE international symposium on networks-on-chip
Diagnosis of multiple arbitrary faults with mask and reinforcement effect
Proceedings of the Conference on Design, Automation and Test in Europe
Machine learning-based volume diagnosis
Proceedings of the Conference on Design, Automation and Test in Europe
Proceedings of the Conference on Design, Automation and Test in Europe
Selection of a fault model for fault diagnosis based on unique responses
Proceedings of the Conference on Design, Automation and Test in Europe
An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis
Journal of Electronic Testing: Theory and Applications
DiSC: a new diagnosis method for multiple scan chain failures
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
On undetectable faults and fault diagnosis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Selection of a fault model for fault diagnosis based on unique responses
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Improved diagnosis using enhanced fault dominance
Integration, the VLSI Journal
Construction and Analysis of Augmented Time Compactors
Journal of Electronic Testing: Theory and Applications
Diagnosis of transition fault clusters
Proceedings of the 48th Design Automation Conference
Structural Test and Diagnosis for Graceful Degradation of NoC Switches
Journal of Electronic Testing: Theory and Applications
On candidate fault sets for fault diagnosis and dominance graphs of equivalence classes
Proceedings of the Conference on Design, Automation and Test in Europe
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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