An efficient method for improving the quality of per-test fault diagnosis

Authors:
Chunsheng Liu
Affiliations:
Dept. of Comput. & Electron. Eng., Nebraska-Lincoln Univ., Omaha, NE, USA
Venue:
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Year:
2004

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Abstract

Per-test fault diagnosis methodology has been shown to be an effective one for the identification of complex defects. We improve a recent per-test technique by applying additional diagnosis on the outputs of the circuit. The new method brings in more evidence to support the true failures, hence improves the diagnostic quality. We show that this method can very well address several problems in previous work.