Fault Diagnosis and Fault Model Aliasing
ISVLSI '05 Proceedings of the IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design
An efficient method for improving the quality of per-test fault diagnosis
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Improve the Quality of Per-Test Fault Diagnosis Using Output Information
Journal of Electronic Testing: Theory and Applications
A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Automated failure population creation for validating integrated circuit diagnosis methods
Proceedings of the 46th Annual Design Automation Conference
Selection of a fault model for fault diagnosis based on unique responses
Proceedings of the Conference on Design, Automation and Test in Europe
Selection of a fault model for fault diagnosis based on unique responses
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Diagnosis of malfunctioning deep-submi ron (DSM) ICs is becoming more difficult due to the increasing sophistication of the manufacturing process and the structural complexity of the IC itself. At the same time, key diagnostic tasks that include defect localization are still solved using primitive models of the IC's defects. This paper explores the use of "fault tuples" in diagnosis. Fault tuples can accurately mimic the complex misbehavior of DSM ICs at the logiclevel, enabling practical diagnosis of large circuits. Initial assessment of the use of fault tuples in diagnosis is performed based on a case study involving one specific category of polysilicon spot defects. Obtained results indicate that fault tuples may enhance diagnosis significantly.