Compact Dictionaries for Fault Diagnosis in Scan-BIST
IEEE Transactions on Computers
An efficient method for improving the quality of per-test fault diagnosis
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
An Efficient Dictionary Organization for Maximum Diagnosis
Journal of Electronic Testing: Theory and Applications
Efficient RT-level fault diagnosis
Journal of Computer Science and Technology
Improve the Quality of Per-Test Fault Diagnosis Using Output Information
Journal of Electronic Testing: Theory and Applications
Proceedings of the conference on Design, automation and test in Europe
Selection of a fault model for fault diagnosis based on unique responses
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Design and analysis of compact dictionaries for diagnosis in scan-BIST
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Diagnostic Test Set Minimization and Full-Response Fault Dictionary
Journal of Electronic Testing: Theory and Applications
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