On Dictionary-Based Fault Location in Digital Logic Circuits
IEEE Transactions on Computers
Universal fault simulation using fault tuples
Proceedings of the 37th Annual Design Automation Conference
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Proceedings of the IEEE International Test Conference on Test and Design Validity
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
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Proceedings of the IEEE International Test Conference 2001
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Proceedings of the IEEE International Test Conference 2001
Full fault dictionary storage based on labeled tree encoding
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Salvaging test windows in BIST diagnostics
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Techniques to Encode and Compress Fault Dictionaries
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
On Pass/Fail Dictionaries for Scan Circuits
ATS '01 Proceedings of the 10th Asian Test Symposium
Dynamic fault dictionaries and two-stage fault isolation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
An Efficient Dictionary Organization for Maximum Diagnosis
Journal of Electronic Testing: Theory and Applications
Accurate Whole-Chip Diagnostic Strategy for Scan Designs with Multiple Faults
Journal of Electronic Testing: Theory and Applications
Design and analysis of compact dictionaries for diagnosis in scan-BIST
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Diagnosis of logic circuits using compressed deterministic data and on-chip response comparison
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Abstract--We present a new technique for generating compact dictionaries for cause-effect fault diagnosis in scan-BIST. This approach relies on the use of three compact dictionaries: 1) {\cal D}_1, containing compacted LFSR signatures for a small number of patterns and faults with high detection probability, 2) an interval-based pass/fail dictionary {\cal D}_2 for the BIST patterns and for faults with relatively lower detection probability, and 3) {\cal D}_3, containing compacted LFSR signatures for clean-up ATPG vectors and random-resistant faults. We show that {\cal D}_2, which is two orders of magnitude smaller than a maximal-resolution pass/fail dictionary, provides nearly the same diagnostic resolution as an uncompacted dictionary. We also show that, by using a 16-bit LFSR signature for {\cal D}_1 and {\cal D}_3, we obtain two to three orders of magnitude reduction in dictionary size, yet nearly no loss in diagnostic resolution. Together, these three compact dictionaries provide an efficient solution to the problem of cause-effect diagnosis in scan-based BIST. These dictionaries can also be used to target unmodeled faults using scoring algorithms.