Integrated fault diagnosis targeting reduced simulation
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Software-based diagnosis for processors
Proceedings of the 39th annual Design Automation Conference
Modeling the Unmodelable: Algorithmic Fault Diagnosis
IEEE Design & Test
Modeling the unknown! Towards model-independent fault and error diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A diagnostic test generation procedure for synchronous sequential circuits based on test elimination
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Fault diagnosis using state information
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
Techniques to Encode and Compress Fault Dictionaries
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Making Cause-Effect Cost Effective: Low-Resolution Fault Dictionaries
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Compact Dictionaries for Fault Diagnosis in Scan-BIST
IEEE Transactions on Computers
Efficient RT-level fault diagnosis methodology
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
An effective technique for minimizing the cost of processor software-based diagnosis in SoCs
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Accurate Whole-Chip Diagnostic Strategy for Scan Designs with Multiple Faults
Journal of Electronic Testing: Theory and Applications
A test pattern ordering algorithm for diagnosis with truncated fail data
Proceedings of the 43rd annual Design Automation Conference
Efficient RT-level fault diagnosis
Journal of Computer Science and Technology
Parallel Algorithms for Dandelion-Like Codes
ICCS '09 Proceedings of the 9th International Conference on Computational Science: Part I
Adaptive Debug and Diagnosis Without Fault Dictionaries
Journal of Electronic Testing: Theory and Applications
Unified parallel encoding and decoding algorithms for Dandelion-like codes
Journal of Parallel and Distributed Computing
Design and analysis of compact dictionaries for diagnosis in scan-BIST
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Parallel algorithms for encoding and decoding blob code
WALCOM'10 Proceedings of the 4th international conference on Algorithms and Computation
Diagnostic Test Set Minimization and Full-Response Fault Dictionary
Journal of Electronic Testing: Theory and Applications
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The process of fault dictionary compaction can lead to a loss of information that is potentially useful in locating unmodeled failures. The focus of this paper is on developing alternative storage structures that can efficiently represent full fault dictionaries without discarding any information. We present the problem of storing the full fault dictionary storage as a labeled tree encoding problem. Two labeled trees are introduced to represent the diagnostic experiment. For the first tree, the unlabeled tree is stored using a binary string code, while the second tree is constructed so that the unlabeled tree is regular in structure, thus allowing implicit storage. Eight alternative representations based on the three label components are presented and two existing full fault dictionary representations (the matrix and the list dictionaries) are shown to be special cases in our general framework. Experimental results on the ISCAS 85 and ISCAS 89 circuits are used to study and characterize the performance of the proposed storage structures.