Computer architecture and organization; (2nd ed.)
Computer architecture and organization; (2nd ed.)
Fault dictionary compaction by output sequence removal
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
On the generation of small dictionaries for fault location
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
The Designer's Guide to VHDL
Making cause-effect cost effective: low-resolution fault dictionaries
Proceedings of the IEEE International Test Conference 2001
Full fault dictionary storage based on labeled tree encoding
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Invariance-Based On-Line Test for RTL Controller-Datapath Circuits
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
RT-level Fault Simulation Based on Symbolic Propagation
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Creating small fault dictionaries [logic circuit fault diagnosis]
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Increasing IC densities necessitate diagnosis methodologies with enhanced defect locating capabilities. Yet the computational effort expended in extracting diagnostic information and the stringent storage requirements constitute major concerns due to the tremendous number of faults in typical ICs. In this paper, we propose an RT-level diagnosis methodology capable of responding to these challenges. In the proposed scheme, diagnostic information is computed on a grouped fault effect basis, enhancing both the storage and the computational aspects. The fault effect grouping criteria are identified based on a module structure analysis, improving the propagation ability of the diagnostic information through RT modules. Experimental results show that the proposed methodology provides superior speed-ups and significant diagnostic information compression at no sacrifice in diagnostic resolution, compared to the existing gate-level diagnosis approaches.