RT-level Fault Simulation Based on Symbolic Propagation

Authors:
Ozgur Sinanoglu;Alex Orailoglu
Affiliations:
-;-
Venue:
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Year:
2001

Citing 0
Cited 2

Efficient RT-level fault diagnosis methodology

Proceedings of the 2004 Asia and South Pacific Design Automation Conference
Efficient RT-level fault diagnosis

Journal of Computer Science and Technology

Quantified Score

Hi-index	0.00

Visualization

Abstract

The rapid rise in size and complexity of VLSI circuits has stimulated a need to handle fault simulation at higher levels of abstraction. We outline an RT-level fault simulation technique that utilizes symbolic data to group fault effects. Experimental results show that the proposed methodology provides superior speed-ups and accurate fault coverages.