Software-based diagnosis for processors
Proceedings of the 39th annual Design Automation Conference
Eliminating the Ouija® Board: Automatic Thresholds and Probabilistic IDDQ Diagnosis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Efficient RT-level fault diagnosis methodology
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
Journal of Electronic Testing: Theory and Applications
An Efficient Dictionary Organization for Maximum Diagnosis
Journal of Electronic Testing: Theory and Applications
A test pattern ordering algorithm for diagnosis with truncated fail data
Proceedings of the 43rd annual Design Automation Conference
Efficient RT-level fault diagnosis
Journal of Computer Science and Technology
Scan test planning for power reduction
Proceedings of the 44th annual Design Automation Conference
Embedded fault diagnosis in digital systems with BIST
Microprocessors & Microsystems
Analytical approach for testing linking-with-light circuits and systems
IMACS'08 Proceedings of the 7th WSEAS International Conference on Instrumentation, Measurement, Circuits and Systems
WSEAS Transactions on Circuits and Systems
Adaptive Debug and Diagnosis Without Fault Dictionaries
Journal of Electronic Testing: Theory and Applications
Design and analysis of compact dictionaries for diagnosis in scan-BIST
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Effective diagnostic pattern generation strategy for transition-delay faults in full-scan SOCs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Diagnostic Test Set Minimization and Full-Response Fault Dictionary
Journal of Electronic Testing: Theory and Applications
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Diagnostic fault simulation can generate enormous amounts of data. The techniques used to manage this data can have significant effect on the outcome of the fault diagnosis procedure. We first demonstrate that if information is removed from a fault dictionary, its ability to diagnose unmodeled faults may be severely curtailed even if dictionary quality metrics remain unaffected; we, therefore, focus on methods for producing small, lossless dictionaries, We present a new dictionary organization based on error sets, which is amenable to standard data-compression techniques. We compare several dictionary organizations and the effect of standard data-compression techniques on each of them. An appropriate organization and encoding makes dictionary-based diagnosis practical for very large circuits