Exact evaluation of diagnostic test resolution
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
On Dictionary-Based Fault Location in Digital Logic Circuits
IEEE Transactions on Computers
Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Diagnostic Fault Simulation of Sequential Circuits
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
A new methodology for improved tester utilization
Proceedings of the IEEE International Test Conference 2001
On static test compaction and test pattern ordering for scan designs
Proceedings of the IEEE International Test Conference 2001
VLSID '99 Proceedings of the 12th International Conference on VLSI Design - 'VLSI for the Information Appliance'
Full fault dictionary storage based on labeled tree encoding
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Defect-Oriented Test Scheduling
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Test Resource Optimization for Multi-Site Testing of SOCs Under ATE Memory Depth Constraints
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Test Economics for Multi-site Test with Modern Cost Reduction Techniques
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Applications of Semiconductor Test Economics, and Multisite Testing to Lower Cost of Test
ITC '99 Proceedings of the 1999 IEEE International Test Conference
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Creating small fault dictionaries [logic circuit fault diagnosis]
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
| Hi-index | 0.00 |
In this paper, we propose a test pattern ordering algorithm for fault diagnosis. Test pattern ordering is effective in situations where the fail log is truncated and contains a limited number of fail data. In such cases, higher diagnostic resolution can be achieved with the test set appropriately ordered. Test pattern ordering is independent of the diagnosis algorithm used. The higher resolution achieved by test pattern ordering is obtained at no additional cost once the test patterns have been appropriately ordered. Experimental results on two industrial designs are presented to demonstrate the effectiveness of the proposed method.