High-Frequency, At-Speed Scan Testing
IEEE Design & Test
Test vector decomposition-based static compaction algorithms for combinational circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
On Maximizing the Fault Coverage for a Given Test Length Limit in a Synchronous Sequential Circuit
IEEE Transactions on Computers
A Measure of Quality for n-Detection Test Sets
IEEE Transactions on Computers
The Accidental Detection Index as a Fault Ordering Heuristic for Full-Scan Circuits
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
A test pattern ordering algorithm for diagnosis with truncated fail data
Proceedings of the 43rd annual Design Automation Conference
Forward-looking reverse order fault simulation for n-detection test sets
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A scalable method for the generation of small test sets
Proceedings of the Conference on Design, Automation and Test in Europe
Improved SAT-based ATPG: more constraints, better compaction
Proceedings of the International Conference on Computer-Aided Design
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