On static compaction of test sequences for synchronous sequential circuits
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Proptest: a property based test pattern generator for sequential circuits using test compaction
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
On static test compaction and test pattern ordering for scan designs
Proceedings of the IEEE International Test Conference 2001
Sequential Circuit Test Generation Using Dynamic State Traversal
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Resource-Constrained Compaction of Sequential Circuit Test Sets
VLSID '00 Proceedings of the 13th International Conference on VLSI Design
Defect-Oriented Test Scheduling
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Vector restoration based static compaction of test sequences for synchronous sequential circuits
ICCD '97 Proceedings of the 1997 International Conference on Computer Design (ICCD '97)
| Hi-index | 14.98 |
When storage requirements or limits on test application time do not allow a complete (compact) test set to be used for a circuit, a partial test set that detects as many faults as possible is required. Motivated by this application, we address the following problem. Given a test sequence T of length L for a synchronous sequential circuit and a length M