A fast and memory-efficient diagnostic fault simulation for sequential circuits
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
On improving fault diagnosis for synchronous sequential circuits
DAC '94 Proceedings of the 31st annual Design Automation Conference
Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Location of Stuck-At Faults and Bridging Faults Based on Circuit Partitioning
IEEE Transactions on Computers
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Automated Diagnosis in Testing and Failure Analysis
IEEE Design & Test
Modeling the unknown! Towards model-independent fault and error diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A diagnostic test generation procedure for synchronous sequential circuits based on test elimination
ITC '98 Proceedings of the 1998 IEEE International Test Conference
GARDA: a diagnostic ATPG for large synchronous sequential circuits
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Multiple fault diagnosis in sequential circuits using sensitizing sequence pairs
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
Fault diagnosis using state information
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Exclusive Test and its Applications to Fault Diagnosis
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Diagnostic Test Generation for Sequential Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis
Proceedings of the conference on Design, automation and test in Europe - Volume 1
A test pattern ordering algorithm for diagnosis with truncated fail data
Proceedings of the 43rd annual Design Automation Conference
Serial diagnostic fault simulation for synchronous sequential circuits
Integration, the VLSI Journal
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