The Multiple Observation Time Test Strategy
IEEE Transactions on Computers - Special issue on fault-tolerant computing
Exact evaluation of diagnostic test resolution
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
Failure Diagnosis of Structured VLSI
IEEE Design & Test
Classification of Faults in Synchronous Sequential Circuits
IEEE Transactions on Computers
Application of Homing Sequences to Synchronous Sequential Circuit Testing
IEEE Transactions on Computers
Diagnostic Fault Simulation of Sequential Circuits
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Diagnosis oriented test pattern generation
EURO-DAC '90 Proceedings of the conference on European design automation
Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists
ACM Transactions on Design Automation of Electronic Systems (TODAES)
A diagnostic test generation procedure for synchronous sequential circuits based on test elimination
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Characterization and Implicit Identification of Sequential Indistinguishability
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Diagnostic Test Pattern Generation for Sequential Circuits
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
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