Graph-Based Algorithms for Boolean Function Manipulation
IEEE Transactions on Computers
Test pattern generation for sequential MOS circuits by symbolic fault simulation
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Efficient implementation of a BDD package
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Shared binary decision diagram with attributed edges for efficient Boolean function manipulation
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Multiple-Fault Simulation and Coverage of Deterministic Single-Fault Test Sets
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
A fast and memory-efficient diagnostic fault simulation for sequential circuits
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
On improving fault diagnosis for synchronous sequential circuits
DAC '94 Proceedings of the 31st annual Design Automation Conference
Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
On adaptive diagnostic test generation
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Location of Stuck-At Faults and Bridging Faults Based on Circuit Partitioning
IEEE Transactions on Computers
Dynamic fault diagnosis on reconfigurable hardware
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists
ACM Transactions on Design Automation of Electronic Systems (TODAES)
A diagnostic test generation procedure for synchronous sequential circuits based on test elimination
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis
Proceedings of the conference on Design, automation and test in Europe - Volume 1
A test pattern ordering algorithm for diagnosis with truncated fail data
Proceedings of the 43rd annual Design Automation Conference
Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware
Journal of Electronic Testing: Theory and Applications
Serial diagnostic fault simulation for synchronous sequential circuits
Integration, the VLSI Journal
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