A fast and memory-efficient diagnostic fault simulation for sequential circuits

Authors:
Jer Min Jou;Shung-Chih Chen
Affiliations:
Department of Electrical Engineering, National Chang Kung University, Tainan, Taiwan, R.O.C.;Department of Electrical Engineering, National Chang Kung University, Tainan, Taiwan, R.O.C.
Venue:
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Year:
1994

Citing 4
Cited 3

Gentest: An Automatic Test-Generation System for Sequential Circuits

Computer
HOPE: an efficient parallel fault simulator for synchronous sequential circuits

DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
Exact evaluation of diagnostic test resolution

DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
Diagnostic Fault Simulation of Sequential Circuits

Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design

Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists

DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Multiple fault diagnosis in sequential circuits using sensitizing sequence pairs

FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
Diagnostic Test Generation for Sequential Circuits

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Quantified Score

Hi-index	0.00

Visualization

Abstract

In this paper, a fast and memory-efficient diagnostic fault simulator for sequential circuits is proposed. In it, a two-level optimization technique is developed and used to prompt the processing speed. In the first high level, an efficient list, which stores the indistinguishable faults so far for each fault during simulation, and the list maintaining algorithm are applied, thus the number of diagnostic comparisons is minimized. In the second low level, a bit-parallel comparison is developed to speed up the comparing process. Therefore, the different diagnostic measure reports for a given test set can be generated very quickly. In addition, the simulator is extended to diagnose the single stuck-at device fault. Experimental results show that this diagnostic simulator achieves a significant speedup compared to previous methods.