Exact evaluation of diagnostic test resolution
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
Fault emulation: a new approach to fault grading
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
DAC '96 Proceedings of the 33rd annual Design Automation Conference
On Dictionary-Based Fault Location in Digital Logic Circuits
IEEE Transactions on Computers
FPGA routing and routability estimation via Boolean satisfiability
FPGA '97 Proceedings of the 1997 ACM fifth international symposium on Field-programmable gate arrays
Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
DAC '98 Proceedings of the 35th annual Design Automation Conference
On the generation of small dictionaries for fault location
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
An Efficient Logic Emulation System
ICCD '92 Proceedings of the 1991 IEEE International Conference on Computer Design on VLSI in Computer & Processors
Satisfiability on reconfigurable hardware
FPL '97 Proceedings of the 7th International Workshop on Field-Programmable Logic and Applications
Solving Satisfiability Problems on FPGAs
FPL '96 Proceedings of the 6th International Workshop on Field-Programmable Logic, Smart Applications, New Paradigms and Compilers
Diagnostic Fault Equivalence Identification Using Redundancy Information and Structural Analysis
Proceedings of the IEEE International Test Conference on Test and Design Validity
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Fault simulation on reconfigurable hardware
FCCM '97 Proceedings of the 5th IEEE Symposium on FPGA-Based Custom Computing Machines
A maximal resolution guided-probe testing algorithm
DAC '81 Proceedings of the 18th Design Automation Conference
Fault diagnosis based on effect-cause analysis: An introduction
DAC '80 Proceedings of the 17th Design Automation Conference
Concurrent D-algorithm on reconfigurable hardware
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Journal of Electronic Testing: Theory and Applications
Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware
Journal of Electronic Testing: Theory and Applications
Reducing fault dictionary size for million-gate large circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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