Diagnostic Fault Equivalence Identification Using Redundancy Information and Structural Analysis

Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits

Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design

Dynamic fault diagnosis on reconfigurable hardware

Proceedings of the 36th annual ACM/IEEE Design Automation Conference

Characterization and Implicit Identification of Sequential Indistinguishability

VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications

Diagnostic Test Pattern Generation for Sequential Circuits

VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium

Implication and Evaluation Techniques for Proving Fault Equivalence

VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium

Diagnostic Test Generation for Sequential Circuits

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Diagnostic and Detection Fault Collapsing for Multiple Output Circuits

Proceedings of the conference on Design, Automation and Test in Europe - Volume 2

Theorems for Fault Collapsing in Combinational Circuits

Journal of Electronic Testing: Theory and Applications

Bilateral Testing of Nano-scale Fault-Tolerant Circuits

Journal of Electronic Testing: Theory and Applications

Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test Generation

Journal of Electronic Testing: Theory and Applications