The Multiple Observation Time Test Strategy
IEEE Transactions on Computers - Special issue on fault-tolerant computing
On improving fault diagnosis for synchronous sequential circuits
DAC '94 Proceedings of the 31st annual Design Automation Conference
Switching and Finite Automata Theory: Computer Science Series
Switching and Finite Automata Theory: Computer Science Series
Advanced Fault Collapsing (Logic Circuits Testing)
IEEE Design & Test
Classification of Faults in Synchronous Sequential Circuits
IEEE Transactions on Computers
Diagnostic Fault Equivalence Identification Using Redundancy Information and Structural Analysis
Proceedings of the IEEE International Test Conference on Test and Design Validity
An ATPG-Based Framework for Verifying Sequential Equivalence
Proceedings of the IEEE International Test Conference on Test and Design Validity
Characterization and Implicit Identification of Sequential Indistinguishability
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Diagnostic Test Pattern Generation for Sequential Circuits
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
State information-based solutions for sequential circuit diagnosis and testing
State information-based solutions for sequential circuit diagnosis and testing
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
Implication and Evaluation Techniques for Proving Fault Equivalence
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Fault Distinguishing Pattern Generation
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Electronic Notes in Theoretical Computer Science (ENTCS)
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