State information-based solutions for sequential circuit diagnosis and testing

Authors:
W. Kent Fuchs;Vamsi Boppana
Affiliations:
-;-
Venue:
State information-based solutions for sequential circuit diagnosis and testing
Year:
1997

Citing 0
Cited 3

Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits

Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Model Checking Based on Sequential ATPG

CAV '99 Proceedings of the 11th International Conference on Computer Aided Verification
Modeling the unknown! Towards model-independent fault and error diagnosis

ITC '98 Proceedings of the 1998 IEEE International Test Conference

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Abstract