Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Diagnostic Fault Simulation of Sequential Circuits
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
A maximal resolution guided-probe testing algorithm
DAC '81 Proceedings of the 18th Design Automation Conference
Integrating an Electron-Beam System into VLSI Fault Diagnosis
IEEE Design & Test
Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis
IEEE Transactions on Computers
Proceedings of the 40th annual Design Automation Conference
Delay Defect Diagnosis Based Upon Statistical Timing Models " The First Step
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
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In this paper, we propose a new method that uses single and multiple fault simulations to diagnose multiple stuck-at faults in combinational circuits. On the assumption that all suspected faults are equally likely in the faulty circuit, multiple fault simulations are performed. Depending on whether or not a multiple fault simulation results in primary output values that agree with the observed values, faults are added to or removed from a set of suspected faults. Faults which are to be added to or removed from the set of suspected faults are determined using single fault simulation. Diagnosis is effected by repeated additions and removals of faults. The effectiveness of the method of diagnosis has been evaluated by experiments conducted on benchmark circuits. The proposed method achieves a small number of suspected faults by simple processing. Thus, the method will be useful as a preprocessing stage of diagnosis using the electron-beam tester.