Delay Defect Diagnosis Based Upon Statistical Timing Models " The First Step

Authors:
Angela Krstic;Li-C. Wang;Kwang-Ting Cheng;Jing-Jia Liou;Magdy S. Abadir
Affiliations:
University of California at Santa Barbara;University of California at Santa Barbara;University of California at Santa Barbara;National Tsing-Hua University;Motorola Inc.
Venue:
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Year:
2003

Citing 14
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Abstract

This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect diagnosis and traditional logic defect diagnosis. We propose different diagnosis algorithms, and evaluate their performance via statistical defect injection and statistical delay fault simulation. With a statistical timing analysis framework developed in the past, we demonstrate the new concepts in delay defect diagnosis, and discuss experimental results based upon benchmark circuits.