Delay Defect Diagnosis Based Upon Statistical Timing Models " The First Step
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Selection of Crosstalk-Induced Faults in Enhanced Delay Test
Journal of Electronic Testing: Theory and Applications
On bounding the delay of a critical path
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Proceedings of the conference on Design, automation and test in Europe
Accurate timing analysis using SAT and pattern-dependent delay models
Proceedings of the conference on Design, automation and test in Europe
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Critical Path Selection for Delay Testing Considering Coupling Noise
Journal of Electronic Testing: Theory and Applications
ATPG-XP: test generation form maximal crosstalk-induced faults
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the 20th symposium on Great lakes symposium on VLSI
On ATPG for multiple aggressor crosstalk faults
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Post-silicon bug detection for variation induced electrical bugs
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Test Vector Generation for Post-Silicon Delay Testing Using SAT-Based Decision Problems
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
A high-precision on-chip path delay measurement architecture
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Simulation-based ATPG for low power testing of crosstalk delay faults in asynchronous circuits
International Journal of Computer Applications in Technology
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