ATPG-XP: test generation form maximal crosstalk-induced faults

Authors:
Sunghoon Chun;Taejin Kim;Sungho Kang
Affiliations:
Department of Computer Science and Engineering, University of California at San Diego, La Jolla, CA;Avionics R&D Laboratory, LIG Nex1 Company, Ltd., Daejeon, Korea;Department of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea
Venue:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Year:
2009

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Abstract

In this paper, we propose a new test-generation method for delay faults considering crosstalk-induced delay effects, based on a conventional delay automatic-test-pattern-generation (ATPG) technique in order to reduce the complexity of previous ATPG algorithms and to consider multiple-aggressor crosstalk faults to maximize the noise of the victim line. Since the proposed ATPG for crosstalk-induced delay faults uses physical and timing information, it can reduce the search space of the backward implication of the aggressor's constraints, and it is helpful for reducing the ATPG time cost compared to previous works. In addition, since the proposed technique targets the critical path for the original delay test as the victim lines, it can improve test effectiveness of delay testing. Experimental results demonstrate the effectiveness of the proposed method.