On testing wave pipelined circuits
DAC '94 Proceedings of the 31st annual Design Automation Conference
A Simulator for At-Speed Robust Testing of Path Delay Faults in Combinational Circuits
IEEE Transactions on Computers
Delay Fault Testing: Choosing Between Random SIC and Random MIC Test Sequences
Journal of Electronic Testing: Theory and Applications
Test Generation for Path Delay Faults Using Binary Decision Diagrams
IEEE Transactions on Computers
Digital oscillation-test method for delay and stuck-at fault testing of digital circuits
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Functional test generation for path delay faults
ATS '95 Proceedings of the 4th Asian Test Symposium
DFSIM: A Gate-Delay Fault Simulator for Sequential Circuits
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Delay Fault Testing: Choosing Between Random SIC and Random MIC Test Sequences
ETW '00 Proceedings of the IEEE European Test Workshop
A Novel Solution for Chip-Level Functional Timing Verification
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
ATPG-XP: test generation form maximal crosstalk-induced faults
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Fastpath: a path-delay test generator for standard scan designs
ITC'94 Proceedings of the 1994 international conference on Test
On path delay testing in a standard scan environment
ITC'94 Proceedings of the 1994 international conference on Test
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