Clocking Schemes for High-Speed Digital Systems
IEEE Transactions on Computers
Timing analysis in a logic synthesis environment
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Analysis and design of latch-controlled synchronous digital circuits
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
A Statistical Model for Delay-Fault Testing
IEEE Design & Test
Random Pattern Testability of Delay Faults
IEEE Transactions on Computers
On Multiple Path Propagating Tests for Path Delay Faults
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Delay Testing Quality in Timing-Optimized Designs
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Delay Testing of Digital Circuits by Output Waveform Analysis
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
On the fault coverage of delay fault detecting tests
EURO-DAC '90 Proceedings of the conference on European design automation
Fault tolerant clockless wave pipeline design
Proceedings of the 1st conference on Computing frontiers
Estimating reliability and throughput of source-synchronous wave-pipelined interconnect
NOCS '09 Proceedings of the 2009 3rd ACM/IEEE International Symposium on Networks-on-Chip
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