Delay Testing of Digital Circuits by Output Waveform Analysis

On testing wave pipelined circuits

DAC '94 Proceedings of the 31st annual Design Automation Conference

RAFT191486: a novel program for rapid-fire test and diagnosis of digital logic for marginal delays and delay faults

ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design

Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Fault Simulation Model for i{DDT} Testing: An Investigation

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium

On-chip delay measurement for silicon debug

Proceedings of the 14th ACM Great Lakes symposium on VLSI

Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip

Journal of Electronic Testing: Theory and Applications

Defect Simulation Methodology for iDDT Testing

Journal of Electronic Testing: Theory and Applications

Circuit techniques for dynamic variation tolerance

Proceedings of the 46th Annual Design Automation Conference

Resilient circuits: enabling energy-efficient performance and reliability

Proceedings of the 2009 International Conference on Computer-Aided Design

On-Chip Delay Measurement Based Response Analysis for Timing Characterization

Journal of Electronic Testing: Theory and Applications

Inexact computing for ultra low-power nanometer digital circuit design

NANOARCH '11 Proceedings of the 2011 IEEE/ACM International Symposium on Nanoscale Architectures

Resilient microprocessor design for improving performance and energy efficiency

Proceedings of the International Conference on Computer-Aided Design