Circuit techniques for dynamic variation tolerance

  • Authors:
  • Keith Bowman;James Tschanz;Chris Wilkerson;Shih-Lien Lu;Tanay Karnik;Vivek De;Shekhar Borkar

  • Affiliations:
  • Intel Corporation, Hillsboro, OR;Intel Corporation, Hillsboro, OR;Intel Corporation, Hillsboro, OR;Intel Corporation, Hillsboro, OR;Intel Corporation, Hillsboro, OR;Intel Corporation, Hillsboro, OR;Intel Corporation, Hillsboro, OR

  • Venue:
  • Proceedings of the 46th Annual Design Automation Conference
  • Year:
  • 2009

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Abstract

Three circuit techniques for dynamic variation tolerance are presented: (i) Sensors with adaptive voltage and frequency circuits, (ii) Tunable replica circuits for timing-error prediction with error recovery, and (iii) Embedded error-detection sequential circuits with error recovery. These circuits mitigate the clock frequency guardbands for dynamic variations, thus improving microprocessor performance and energy-efficiency. These circuits are described with a focus on the different trade-offs in guardband reduction and design overhead. Opportunities for CAD to further enhance microprocessor performance and energy efficiency are offered.