On testing wave pipelined circuits
DAC '94 Proceedings of the 31st annual Design Automation Conference
Logical effort: designing fast CMOS circuits
Logical effort: designing fast CMOS circuits
Architecture evaluation for power-efficient FPGAs
FPGA '03 Proceedings of the 2003 ACM/SIGDA eleventh international symposium on Field programmable gate arrays
Statistical timing analysis in sequential circuit for on-chip global interconnect pipelining
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IEEE Design & Test
Jitter in Deep Sub-Micron Interconnect
ISVLSI '05 Proceedings of the IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design
Wave-pipelined on-chip global interconnect
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
High Rate Wave-pipelined Asynchronous On-chip Bit-serial Data Link
ASYNC '07 Proceedings of the 13th IEEE International Symposium on Asynchronous Circuits and Systems
Parallel vs. serial on-chip communication
Proceedings of the 2008 international workshop on System level interconnect prediction
Global interconnections in FPGAs: modeling and performance analysis
Proceedings of the 2008 international workshop on System level interconnect prediction
Design and optimization of on-chip interconnects using wave-pipelined multiplexed routing
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A reconfigurable source-synchronous on-chip network for GALS many-core platforms
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - Special issue on the 2009 ACM/IEEE international symposium on networks-on-chip
Effect of serialized routing resources on the implementation area of datapath circuits on FPGAS
WSEAS Transactions on Computers
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Wave pipelining has gained attention for NoC interconnect by its promise of high bandwidth using simple circuits. Reliability issues must be addressed before wave pipelining can be used in practice; so, we develop a statistical model of dynamic timing uncertainty. We show that it is important to distinguish between static and dynamic sources of timing uncertainty, because source-synchronous wave pipelining is much more sensitive to the latter. We use HSPICE simulations to develop a model for a wave pipelined link in a 65nm CMOS process and apply a statistical approach to determine the achievable throughput at acceptable bit-error rates. Reliability estimates show that a modest amount of dynamic noise can cut achievable throughput in half for a ten-stage wave-pipelined link, and will further degrade longer links. After accounting for noise, traditional globally synchronous design is shown to offer higher throughput than the wave-pipelined design.