On testing wave pipelined circuits
DAC '94 Proceedings of the 31st annual Design Automation Conference
COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Gate delay fault test generation for non-scan circuits
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Speed Binning with Path Delay Test in 150-nm Technology
IEEE Design & Test
Low Voltage Test in Place of Fast Clock in DDSI Delay Test
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Evaluation of the statistical delay quality model
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
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