COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits

Authors:
Lakshmi N. Reddy;Irith Pomeranz;Sudhakar M. Reddy
Affiliations:
Dept. of Electrical & Computer Engg., The University of Iowa, Iowa City, IA;-;-
Venue:
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Year:
1992

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