COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Genetic Algorithms in Search, Optimization and Machine Learning
Genetic Algorithms in Search, Optimization and Machine Learning
RT-Level ITC'99 Benchmarks and First ATPG Results
IEEE Design & Test
Effective Techniques for High-Level ATPG
ATS '01 Proceedings of the 10th Asian Test Symposium
Evolutionary Techniques for Minimizing Test Signals Application Time
Proceedings of the Applications of Evolutionary Computing on EvoWorkshops 2002: EvoCOP, EvoIASP, EvoSTIM/EvoPLAN
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The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and its reduction has been the target of many efforts in the past. This paper proposes a new method for reducing the test length by adopting a new architecture and exploiting an evolutionary optimization algorithm. A prototype of the proposed approach was tested on ISCAS standard benchmarks and the experimental results show its effectiveness.