ITC '01 Proceedings of the 2001 IEEE International Test Conference
Simulating Realistic Bridging and Crosstalk Faults in an Industrial Setting
Journal of Electronic Testing: Theory and Applications
Using a Periodic Square Wave Test Signal to Detect Crosstalk Faults
IEEE Design & Test
A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines
Journal of Electronic Testing: Theory and Applications
ATPG-XP: test generation form maximal crosstalk-induced faults
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Novel physical unclonable function with process and environmental variations
Proceedings of the Conference on Design, Automation and Test in Europe
Journal of Electronic Testing: Theory and Applications
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Due to technology scaling and increasing clock frequency, problems due to noise effects are leading to an increase in design/debugging efforts and a decrease in circuit performance. This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk-induced effects, such as pulses, signal speedup and slowdown, in digital combinational circuits. We have developed a mixed-signal test generator, called XGEN, that incorporates classical static values as well as dynamic signals such as transitions and pulses, and timing information such as signal arrival times, rise/fall times and gate delay. In this paper, we first discuss the general framework of the test generation algorithm followed by computational results. A comparison of our results with SPICE simulations confirms the accuracy of this approach.