Non-robust Test Generation for Crosstalk-Induced Delay Faults

Authors:
Pei-Fu Shen;Hua-Wei Li;Yong-Jun Xu;Xiao-Wei Li
Affiliations:
Beijing Normal University, Beijing;Chinese Academy of Sciences, Beijing;Chinese Academy of Sciences, Beijing;Chinese Academy of Sciences, Beijing
Venue:
ATS '05 Proceedings of the 14th Asian Test Symposium on Asian Test Symposium
Year:
2005

Citing 0
Cited 3

Critical Path Selection for Delay Testing Considering Coupling Noise

Journal of Electronic Testing: Theory and Applications
ATPG-XP: test generation form maximal crosstalk-induced faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Test generation for crosstalk-induced delay faults in VLSI circuits using modified FAN algorithm

VLSI Design

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Abstract

Crosstalk issues in deep sub-micron (DSM) cause severe design validation and test problems. This paper addresses the problems of delay test considering crosstalkinduced effects, and proposes a non-robust delay test generation method based on single precise crosstalkinduced path delay fault (S-PCPDF) model. With some necessary static timing analysis, the target crosstalkinduced delay fault set was reduced. And the delay test generation for crosstalk-induced delay faults can be implemented by few alterations of non-robust path delay test generation algorithms whereas the timing information is only considered during the selection of target faults. Experimental results on ISCAS'89 and ITC'99 benchmark circuits showed that the proposed method does efficiently for circuits of reasonable sizes, and the CPU time is acceptable.