Robust Test Generation for Precise Crosstalk-induced Path Delay Faults

Authors:
Huawei Li;Peifu Shen;Xiaowei Li
Affiliations:
Chinese Academy of Sciences, China;Beijing Normal University, China;Chinese Academy of Sciences, China
Venue:
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
Year:
2006

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Abstract

Path delay fault simulation performance on multi-cycle delay paths common in industrial designs is discussed using paths from a large block in a microprocessor and a functional test vector suite. We profile fault simulation performance using a novel ...