A novel approach to delay-fault diagnosis

On diagnosis of pattern-dependent delay faults

Proceedings of the 37th Annual Design Automation Conference

A new path-oriented effect-cause methodology to diagnose delay failures

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models

Proceedings of the 40th annual Design Automation Conference

A trace-based method for delay fault diagnosis in synchronous sequential circuits

EDTC '95 Proceedings of the 1995 European conference on Design and Test

Adaptive Techniques for Improving Delay Fault Diagnosis

VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium

Delay Defect Diagnosis Based Upon Statistical Timing Models " The First Step

DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1

Fault Diagnosis and Fault Model Aliasing

ISVLSI '05 Proceedings of the IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design

Diagnosis framework for locating failed segments of path delay faults

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Selection of a fault model for fault diagnosis based on unique responses

Proceedings of the Conference on Design, Automation and Test in Europe

Selection of a fault model for fault diagnosis based on unique responses

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Diagnosis of transition fault clusters

Proceedings of the 48th Design Automation Conference